Abstract. The research helds inelectrical product manufacturing company, focus of the
product is Blu-ray Disc Player. The dominant problem caused by electrical test at the product
development process is Malfunction at AC Transient test where contribution is 83% from
total electrical problem. Main objectives of this research are to determine the vital factors and
provide optimal solution to reduce/elimate these problem at development stage. The problem
solving methodology using Six Sigma DMAIC and DOE .The analysis indicated that line
filter value and spark gap distance in the PCB SMPS are vital factors that influence the
malfunction defective as AC Transient test result. The design of experiment (DOE) technique
use to define the optimum values of vital factor‟s needed to reduce/eliminate the defect. As a
result, a reduction of malfunction defective at AC Transient test was achieved, from 125000
ppm to 0 ppm and thus improve its Sigma level from 2.65 to 6.
Keywords:Defective reduction, DMAIC, DOE, malfunction defective, AC Transient test.